@article{oai:shizuoka.repo.nii.ac.jp:00000436,
 author = {小西, 祐作 and 鈴木, 誠之 and 狩野, 謙一},
 journal = {静岡大学地球科学研究報告},
 month = {Jul},
 note = {application/pdf, While measuring illite crystallinity (IC) on the same slides, significant differences in results were recognized between two different X-ray difractometers. Hence, standardization of IC data has been performed using Crystallinity Index Standard (CIS) samples. The measured IC values show good linear correlation with the CIS values. No significant differences existed in the high crystallinity range belonging to epizone, whereas in the low crystallinity range between the lower anchizone and the diagenetic zone, the CIS calibrated values indicate lower crystallinity (higher IC values) than the non-calibrated ones. Ac-cording to these results, we re-evaluate the IC values previously presented.},
 pages = {11--15},
 title = {イライト結晶度データのCIS標準化 : 静岡大学理学部地球科学教室の場合},
 volume = {27},
 year = {2000}
}