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Single-Electron Charging in Phosphorus Donors in Silicon Observed by Low-Temperature Kelvin Probe Force Microscope
名前 / ファイル | ライセンス | アクション |
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Item type | 学術雑誌論文 / Journal Article_01(1) | |||||||||||
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公開日 | 2011-10-04 | |||||||||||
タイトル | ||||||||||||
言語 | en | |||||||||||
タイトル | Single-Electron Charging in Phosphorus Donors in Silicon Observed by Low-Temperature Kelvin Probe Force Microscope | |||||||||||
言語 | ||||||||||||
言語 | eng | |||||||||||
資源タイプ | ||||||||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||||||||
資源タイプ | journal article | |||||||||||
著者 |
Anwar, Miftahul
× Anwar, Miftahul× Kawai, Yuya× Moraru, Daniel
WEKO
817
× Nowak, Roland× Jablonski, Ryszard
WEKO
4376
× Mizuno, Takeshi× Tabe, Michiharu
WEKO
812
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書誌情報 |
Japanese Journal of Applied Physics 巻 50, 号 8, p. 08LB10, 発行日 2011-08-22 |
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出版者 | ||||||||||||
出版者 | Japan Society of Applied Physics | |||||||||||
権利情報 | ||||||||||||
権利情報 | © 2011 The Japan Society of Applied Physics | |||||||||||
NDC | ||||||||||||
主題Scheme | NDC | |||||||||||
主題 | 549 | |||||||||||
抄録 | ||||||||||||
内容記述タイプ | Abstract | |||||||||||
内容記述 | Kelvin probe force microscopy (KFM) working at low temperatures (13 K) is used to study local electronic potential fluctuations induced by individual phosphorus donors. Electronic potential maps were measured at the surface of thin phosphorus-doped channel of silicon-on-insulator field-effect transistors for different values of backgate voltage. We observed local changes of the potential profile with increasing backgate voltage, indicating electron injection in the channel. Single-step changes in the depth of the fine potential wells, observed by changing backgate voltage, are ascribed to single-electron charging in individual donors. For clusters of donors, with overlapped potential wells, electron charging occurs gradually, without single-step behavior, as the backgate voltage becomes more positive. | |||||||||||
ISSN | ||||||||||||
収録物識別子タイプ | ISSN | |||||||||||
収録物識別子 | 00214922 | |||||||||||
EISSN | ||||||||||||
収録物識別子タイプ | ISSN | |||||||||||
収録物識別子 | 13474065 | |||||||||||
NII書誌ID | ||||||||||||
収録物識別子タイプ | NCID | |||||||||||
収録物識別子 | AA12295836 | |||||||||||
出版者DOI | ||||||||||||
関連タイプ | isVersionOf | |||||||||||
識別子タイプ | DOI | |||||||||||
関連識別子 | 10.1143/JJAP.50.08LB10 | |||||||||||
関連サイト | ||||||||||||
識別子タイプ | URI | |||||||||||
関連識別子 | http://jjap.jsap.jp/link?JJAP/50/08LB10/ | |||||||||||
関連名称 | http://jjap.jsap.jp/link?JJAP/50/08LB10/ | |||||||||||
フォーマット | ||||||||||||
内容記述タイプ | Other | |||||||||||
内容記述 | application/pdf | |||||||||||
著者版フラグ | ||||||||||||
出版タイプ | AM | |||||||||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa |